Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9507945 | Method and apparatus for automated vulnerability detection | Yanni Kouskoulas, Douglas Charles Schmidt, C. Durward McDonell, III, Laura J. Glendenning, Ryan W. Gardner +4 more | 2016-11-29 |
| 8326579 | Method and system for program execution integrity measurement | Perry Wilson, J. Aaron Pendergrass, C. Durward McDonell, III, Peter A. Loscocco, Bessie Y. Lewis | 2012-12-04 |
| 7904278 | Methods and system for program execution integrity measurement | Perry Wilson, J. Aaron Pendergrass, C. Durward McDonell, III, Peter A. Loscocco, Bessie Y. Lewis | 2011-03-08 |
| 6066561 | Apparatus and method for electrical determination of delamination at one or more interfaces within a semiconductor wafer | Kiran Kumar | 2000-05-23 |
| 6016009 | Integrated circuit with tungsten plug containing amorphization layer | Valeriy Y. Sukharev | 2000-01-18 |
| 5804249 | Multistep tungsten CVD process with amorphization step | Valeriy Y. Sukharev | 1998-09-08 |
| 5769692 | On the use of non-spherical carriers for substrate chemi-mechanical polishing | Nicholas F. Pasch, Jayashree Kalpathy Cramer | 1998-06-23 |