HB

Hemanshu Bhatt

Lsi Logic: 17 patents #73 of 1,957Top 4%
LS Lsi: 9 patents #135 of 1,740Top 8%
VP Virginia Tech Intellectual Properties: 2 patents #201 of 1,095Top 20%
ED Empire Technology Development: 2 patents #194 of 547Top 40%
ON onsemi: 2 patents #740 of 1,901Top 40%
Sharp Kabushiki Kaisha: 2 patents #5,184 of 10,731Top 50%
NA Nantero: 1 patents #52 of 73Top 75%
Overall (All Time): #85,586 of 4,157,543Top 3%
38
Patents All Time

Issued Patents All Time

Showing 25 most recent of 38 patents

Patent #TitleCo-InventorsDate
12040635 System and method for dynamically balancing power from distributed power sources in a battery pack Sunit Tyagi, Jitendra Apte, Anupam Hudait, Ranjith Nandakumar, Santhosha Gowda +2 more 2024-07-16
11569668 System and method for dynamic balancing power in a battery pack Sunit Tyagi, Jitendra Apte, Anupam Hudait, Ranjith Nandakumar, Pooja Sharma +4 more 2023-01-31
11183839 DC-DC power conversion system Jitendra Apte, Alok Srivastava, Sunit Tyagi, Dipti Kapadia, Vinod Kumar Singh +2 more 2021-11-23
9739934 Method for producing fibers having optical effect-producing nanostructures Sunit Tyagi 2017-08-22
9577548 Power conversion for distributed DC source array Sunit Tyagi 2017-02-21
8940199 Method for producing fibers having optical effect-producing nanostructures Sunit Tyagi 2015-01-27
8772865 MOS transistor structure Jeffrey Pearse, Prasad Venkatraman, James Sellers 2014-07-08
8552560 Alternate pad structures/passivation inegration schemes to reduce or eliminate IMC cracking in post wire bonded dies during Cu/Low-K BEOL processing Dilip Vijay, Jayanthi Pallinti, Sey-Shing Sun, Hong Ying, Chiyi Kao 2013-10-08
8552587 Power conversion for distributed DC source array Sunit Tyagi 2013-10-08
8304314 Method of forming an MOS transistor Jeffrey Pearse, Prasad Venkatraman, James Sellers 2012-11-06
8076779 Reduction of macro level stresses in copper/low-K wafers Sey-Shing Sun, Jayanthi Pallinti, Dilip Vijay, Hong Ying, Chiyi Kao +1 more 2011-12-13
7955919 Spacer-less transistor integration scheme for high-K gate dielectrics and small gate-to-gate spaces applicable to Si, SiGe and strained silicon schemes David Pritchard, David T. Price 2011-06-07
7915122 Self-aligned cell integration scheme Richard J. Carter, Shiqun Gu, Peter A. Burke, James R. B. Elmer, Sey-Shing Sun +2 more 2011-03-29
7582566 Method for redirecting void diffusion away from vias in an integrated circuit design Derryl D. J. Allman, Charles E. May, Peter A. Burke, Byung Sung Kwak, Sey-Shing Sun +2 more 2009-09-01
7531442 Eliminate IMC cracking in post wirebonded dies: macro level stress reduction by modifying dielectric/metal film stack in be layers during Cu/Low-K processing Jayanthi Pallinti, Dilip Vijay, Sey-Shing Sun, Hong Ying, Chiyi Kao +3 more 2009-05-12
7456076 Techniques for forming passive devices during semiconductor back-end processing Santosh Menon 2008-11-25
7436040 Method and apparatus for diverting void diffusion in integrated circuit conductors Derryl D. J. Allman, Charles E. May, Peter A. Burke, Byung Sung Kwak, Sey-Shing Sun +2 more 2008-10-14
7402770 Nano structure electrode design Sey-Shing Sun, Peter A. Burke, Richard J. Carter 2008-07-22
7384801 Integrated circuit with inductor having horizontal magnetic flux lines Jan Fure, Derryl D. J. Allman 2008-06-10
7361965 Method and apparatus for redirecting void diffusion away from vias in an integrated circuit design Derryl D. J. Allman, Charles E. May, Peter A. Burke, Byung Sung Kwak, Sey-Shing Sun +2 more 2008-04-22
7259083 Local interconnect manufacturing process Santosh Menon, David Pritchard 2007-08-21
7253497 Integrated circuit with inductor having horizontal magnetic flux lines Jan Fure, Derryl D. J. Allman 2007-08-07
7205673 Reduce or eliminate IMC cracking in post wire bonded dies by doping aluminum used in bond pads during Cu/Low-k BEOL processing Jayanthi Pallinti, Dilip Vijay, Sey-Shing Sun, Hong Ying, Chiyi Kao 2007-04-17
7122436 Techniques for forming passive devices during semiconductor back-end processing Santosh Menon 2006-10-17
6982206 Mechanism for improving the structural integrity of low-k films Michael Berman, Steven Reder 2006-01-03