Issued Patents All Time
Showing 26–30 of 30 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9164397 | Optics symmetrization for metrology | Amnon Manassen, Daniel Kandel, Moshe Baruch, Joel Seligson, Alexander Svizher +4 more | 2015-10-20 |
| 9080971 | Metrology systems and methods | Daniel Kandel, Vladimir Levinski, Alexander Svizher, Joel Seligson, Andrew V. Hill +6 more | 2015-07-14 |
| 8873054 | Metrology systems and methods | Daniel Kandel, Vladimir Levinski, Alexander Svizher, Joel Seligson, Andrew V. Hill +6 more | 2014-10-28 |
| 8582114 | Overlay metrology by pupil phase analysis | Amnon Manassen, Daniel Kandel, Moshe Baruch, Vladimir Levinski, Noam Sapiens +4 more | 2013-11-12 |
| 8441639 | Metrology systems and methods | Daniel Kandel, Vladimir Levinski, Alexander Svizher, Joel Seligson, Andrew V. Hill +6 more | 2013-05-14 |