Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9875946 | On-device metrology | Andrei V. Shchegrov, Jonathan M. Madsen, Stilian Ivanov Pandev, Ady Levy, Daniel Kandel +1 more | 2018-01-23 |
| 8175373 | Use of design information and defect image information in defect classification | Gordon Abbott, Christophe David Fouquet, Takuji Tada | 2012-05-08 |