Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8194968 | Methods and systems for using electrical information for a device being fabricated on a wafer to perform one or more defect-related functions | Allen Park, Peter Rose, Ellis Chang, Brian Duffy, Mark A. McCord | 2012-06-05 |
| 8175373 | Use of design information and defect image information in defect classification | Christophe David Fouquet, Ori Tadmor, Takuji Tada | 2012-05-08 |
| 7904845 | Determining locations on a wafer to be reviewed during defect review | Christophe David Fouquet, Ellis Chang, Zain Saidin | 2011-03-08 |