Issued Patents All Time
Showing 26–37 of 37 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5869833 | Electron beam dose control for scanning electron microscopy and critical dimension measurement instruments | Farid Askary, Stefano E. Concina, Kevin M. Monahan, David L. Adler | 1999-02-09 |
| 5467832 | Method for directionally drilling a borehole | Jacques Orban | 1995-11-21 |
| 5448227 | Method of and apparatus for making near-bit measurements while drilling | Jacques Orban | 1995-09-05 |
| 5270643 | Pulsed laser photoemission electron-beam probe | Kenneth Wilsher | 1993-12-14 |
| 5210487 | Double-gated integrating scheme for electron beam tester | Hitoshi Takahashi, Douglas K. Masnaghetti | 1993-05-11 |
| 5144225 | Methods and apparatus for acquiring data from intermittently failing circuits | Christopher G. Talbot | 1992-09-01 |
| 5140164 | IC modification with focused ion beam system | Christopher G. Talbot, Douglas K. Masnaghetti | 1992-08-18 |
| 4912405 | Magnetic lens and electron beam deflection system | — | 1990-03-27 |
| 4864228 | Electron beam test probe for integrated circuit testing | — | 1989-09-05 |
| 4721909 | Apparatus for pulsing electron beams | — | 1988-01-26 |
| 4706019 | Electron beam test probe system for analyzing integrated circuits | — | 1987-11-10 |
| 4607693 | Side-entry sub | — | 1986-08-26 |