Issued Patents All Time
Showing 26–50 of 55 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8390822 | Intra-oral three-dimensional imaging system | Robert F. Dillon, Bing Zhao | 2013-03-05 |
| 8330947 | Back quartersphere scattered light analysis | Richard E. Bills, Klaus Freischlad, James P. McNiven | 2012-12-11 |
| 8059268 | Inspecting a workpiece using polarization of scattered light | Ian T. Kohl, Songping Gao, Richard E. Bills | 2011-11-15 |
| 7751063 | Multiple channel interferometric surface contour measurement system | Robert F. Dillon, Yi Qian, Yunqing Zhu, D. Scott Ackerson, Gurpreet Singh | 2010-07-06 |
| 7623227 | System and method for inspecting a workpiece surface using polarization of scattered light | Ian T. Kohl, Songping Gao, Richard E. Bills | 2009-11-24 |
| 7605913 | System and method for inspecting a workpiece surface by analyzing scattered light in a front quartersphere region above the workpiece | Richard E. Bills, Klaus Freischlad, James P. McNiven | 2009-10-20 |
| 7599071 | Determining positional error of an optical component using structured light patterns | Robert F. Dillon, Roy D. Allen, Yi Qian | 2009-10-06 |
| 7595892 | Multiple channel interferometric surface contour measurement system | Robert F. Dillon | 2009-09-29 |
| 7539584 | Volume based extended defect sizing system | Ernest Bell | 2009-05-26 |
| 7505125 | System and method for signal processing for a workpiece surface inspection system | Scott James Andrews, Bills Richard Earl, Timothy R. Tiemeyer | 2009-03-17 |
| 7302360 | Defect size projection | — | 2007-11-27 |
| 7184928 | Extended defect sizing | Michael Murphree | 2007-02-27 |
| 6829223 | Computer network physical-layer analysis method and system | William M. Richardson | 2004-12-07 |
| 6745137 | Single ended attenuation measurement | Srivathsan Krishnamachari, Ali Haghighi-Mood | 2004-06-01 |
| 6675328 | System and method to determine data throughput in a communication network | Srivathsan Krishnamachari | 2004-01-06 |
| 6657437 | Method and system for performing time domain reflectometry contemporaneously with recurrent transmissions on computer network | Dorian LeCroy, William M. Richardson | 2003-12-02 |
| 6556941 | Separation of periodic and non-periodic signal components | Roy E. Mallory | 2003-04-29 |
| 5704365 | Using related signals to reduce ECG noise | Paul Albrecht, Jeffrey M. Arnold, Richard J. Cohen | 1998-01-06 |
| 5572448 | Enhanced resolution imaging and measurement systems | — | 1996-11-05 |
| 5420803 | Enhanced resolution wafer thickness measurement system | — | 1995-05-30 |
| 5165094 | Partially constrained minimum energy state controller | — | 1992-11-17 |
| 4860229 | Wafer flatness station | Robert C. Abbe, Noel S. Poduje | 1989-08-22 |
| 4849916 | Improved spatial resolution measurement system and method | Robert C. Abbe, Noel S. Poduje | 1989-07-18 |
| 4774960 | Method and apparatus for measuring blood pressure | Jeff Arnold, Michael P. Zelin | 1988-10-04 |
| 4750141 | Method and apparatus for separating fixture-induced error from measured object characteristics and for compensating the measured object characteristic with the error, and a bow/warp station implementing same | Noel S. Poduje | 1988-06-07 |