Issued Patents All Time
Showing 25 most recent of 29 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10775507 | Adaptive transmission power control for a LIDAR | Shingo Mandai, Cristiano L. Niclass, Moshe Laifenfeld, Mina Rezk, Alexander Shpunt +5 more | 2020-09-15 |
| 10712446 | Remote sensing for detection and ranging of objects | Micah P. Kalscheur, Evan C. Cull, Ryan A. Gibbs | 2020-07-14 |
| 10656275 | Remote sensing for detection and ranging of objects | Micah P. Kalscheur, Evan C. Cull, Ryan A. Gibbs | 2020-05-19 |
| 10445896 | Systems and methods for determining object range | Micah P. Kalscheur, Evan C. Cull, Ryan A. Gibbs, Ashwin Ashok Wagadarikar | 2019-10-15 |
| 10305247 | Radiation source with a small-angle scanning array | Andrew J. Sutton, Cristiano L. Niclass, Mina Rezk | 2019-05-28 |
| 10018572 | Front quartersphere scattered light analysis | Neil Judell, Klaus Freischlad, James P. McNiven | 2018-07-10 |
| 9528942 | Front quartersphere scattered light analysis | Neil Judell, Klaus Freischlad, James P. McNiven | 2016-12-27 |
| 9518930 | Scattered light measurement system | Neil Judell, Ian T. Kohl, Songping Gao | 2016-12-13 |
| 9488591 | Front quartersphere scattered light analysis | Neil Judell, Klaus Freischlad, James P. McNiven | 2016-11-08 |
| 9110033 | Front quartersphere scattered light analysis | Neil Judell, Klaus Freischlad, James P. McNiven | 2015-08-18 |
| 9103800 | System with multiple scattered light collectors | Neil Judell, Timothy R. Tiemeyer, James P. McNiven | 2015-08-11 |
| 8553215 | Back quartersphere scattered light analysis | Neil Judell | 2013-10-08 |
| 8537350 | Inspecting a workpiece using scattered light | Neil Judell, Ian T. Kohl, Songping Gao | 2013-09-17 |
| 8497984 | System and method for inspection of a workpiece surface using multiple scattered light collectors | Neil Judell, Timothy R. Tiemeyer, James P. McNiven | 2013-07-30 |
| 8330947 | Back quartersphere scattered light analysis | Neil Judell, Klaus Freischlad, James P. McNiven | 2012-12-11 |
| 8059268 | Inspecting a workpiece using polarization of scattered light | Neil Judell, Ian T. Kohl, Songping Gao | 2011-11-15 |
| 7839495 | System and method for controlling a beam source in a workpiece surface inspection system | Bruce Baran, Chris L. Koliopoulos, Songping Gao, Michael Murphree | 2010-11-23 |
| 7659974 | System and method for controlling light scattered from a workpiece surface in a surface inspection system | James P. McNiven | 2010-02-09 |
| 7623227 | System and method for inspecting a workpiece surface using polarization of scattered light | Neil Judell, Ian T. Kohl, Songping Gao | 2009-11-24 |
| 7605913 | System and method for inspecting a workpiece surface by analyzing scattered light in a front quartersphere region above the workpiece | Neil Judell, Klaus Freischlad, James P. McNiven | 2009-10-20 |
| 7557910 | System and method for controlling a beam source in a workpiece surface inspection system | Bruce Baran, Chris L. Koliopoulos, Songping Gao, Michael Murphree | 2009-07-07 |
| 7417722 | System and method for controlling light scattered from a workpiece surface in a surface inspection system | James P. McNiven | 2008-08-26 |
| 6529270 | Apparatus and method for detecting defects in the surface of a workpiece | — | 2003-03-04 |
| 6366319 | Subtractive color processing system for digital imaging | — | 2002-04-02 |
| 5766827 | Process of imaging black metal thermally imageable transparency elements | Hsin-hsin Chou, Thomas A. Isberg, Charles Cheng-Hsing Lee, William V. Dower, Martin B. Wolk +1 more | 1998-06-16 |