Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9518930 | Scattered light measurement system | Neil Judell, Ian T. Kohl, Richard E. Bills | 2016-12-13 |
| 9110023 | Optical system | — | 2015-08-18 |
| 8624200 | Optical detection system | — | 2014-01-07 |
| 8537350 | Inspecting a workpiece using scattered light | Neil Judell, Ian T. Kohl, Richard E. Bills | 2013-09-17 |
| 8427637 | Optical detection system | — | 2013-04-23 |
| 8059268 | Inspecting a workpiece using polarization of scattered light | Neil Judell, Ian T. Kohl, Richard E. Bills | 2011-11-15 |
| 7839495 | System and method for controlling a beam source in a workpiece surface inspection system | Bruce Baran, Chris L. Koliopoulos, Richard E. Bills, Michael Murphree | 2010-11-23 |
| 7623227 | System and method for inspecting a workpiece surface using polarization of scattered light | Neil Judell, Ian T. Kohl, Richard E. Bills | 2009-11-24 |
| 7557910 | System and method for controlling a beam source in a workpiece surface inspection system | Bruce Baran, Chris L. Koliopoulos, Richard E. Bills, Michael Murphree | 2009-07-07 |
| 6122047 | Methods and apparatus for identifying the material of a particle occurring on the surface of a substrate | John C. Stover, Michael E. Fossey, Lee D. Clementi | 2000-09-19 |