MF

Michael E. Fossey

AS Ade Optical Systems: 6 patents #1 of 11Top 10%
MA Max-Viz: 3 patents #3 of 3Top 100%
EI Electro Scientific Industries: 1 patents #145 of 314Top 50%
FS Flir Systems: 1 patents #214 of 411Top 55%
SE Sentrol: 1 patents #14 of 34Top 45%
Overall (All Time): #383,466 of 4,157,543Top 10%
13
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
RE45452 System for and method of synchronous acquisition of pulsed source light in performance of monitoring aircraft flight operation J. Richard Kerr, Gregory A. Zuro 2015-04-07
RE44604 System for and method of synchronous acquisition of pulsed source light in performance of monitoring aircraft flight operation J. Richard Kerr, Gregory A. Zuro 2013-11-19
7705879 System for and method of synchronous acquisition of pulsed source light in performance of monitoring aircraft flight operation J. Richard Kerr, Gregory A. Zuro 2010-04-27
6509965 Wafer inspection system for distinguishing pits and particles John C. Stover, Lee D. Clementi 2003-01-21
6292259 Wafer inspection system for distinguishing pits and particles John C. Stover 2001-09-18
6122047 Methods and apparatus for identifying the material of a particle occurring on the surface of a substrate John C. Stover, Songping Gao, Lee D. Clementi 2000-09-19
6118525 Wafer inspection system for distinguishing pits and particles John C. Stover, Lee D. Clementi 2000-09-12
5988971 Wafer transfer robot Kirk R. Johnson, Noel S. Poduje 1999-11-23
5712701 Surface inspection system and method of inspecting surface of workpiece Lee D. Clementi 1998-01-27
5565852 Smoke detector with digital display Mark A. Peltier, Douglas H. Marman, David S. Terrett 1996-10-15
5361268 Switchable two-wavelength frequency-converting laser system and power control therefor Yunlong Sun 1994-11-01
4916536 Imaging range finder and method James R. Kerr, David M. Aikens, Bruce Cannon, John J. McDonald 1990-04-10
4698785 Method and apparatus for detecting control system data processing errors John P. Desmond, Douglas W. Ford, Michael Stanbro, Kenneth A. Zimmerman 1987-10-06