Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9103800 | System with multiple scattered light collectors | Richard E. Bills, Neil Judell, James P. McNiven | 2015-08-11 |
| 8497984 | System and method for inspection of a workpiece surface using multiple scattered light collectors | Richard E. Bills, Neil Judell, James P. McNiven | 2013-07-30 |
| 8260035 | Threshold determination in an inspection system | Mehmet Nejat Tek, Andrey Vertikov | 2012-09-04 |
| 7505125 | System and method for signal processing for a workpiece surface inspection system | Scott James Andrews, Neil Judell, Bills Richard Earl | 2009-03-17 |
| 7286218 | System and method for inspecting a workpiece surface using surface structure spatial frequencies | James Akutsu | 2007-10-23 |
| 7280200 | Detection of a wafer edge using collimated light | Mark Plemmons | 2007-10-09 |