Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9702829 | Systems and methods for wafer surface feature detection and quantification | Haiguang Chen, Jaydeep Sinha, Sergey Kamensky, Enrique Chavez, Shouhong Tang | 2017-07-11 |
| 7280200 | Detection of a wafer edge using collimated light | Timothy R. Tiemeyer | 2007-10-09 |