Issued Patents All Time
Showing 1–19 of 19 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10018572 | Front quartersphere scattered light analysis | Richard E. Bills, Neil Judell, James P. McNiven | 2018-07-10 |
| 9528942 | Front quartersphere scattered light analysis | Richard E. Bills, Neil Judell, James P. McNiven | 2016-12-27 |
| 9488591 | Front quartersphere scattered light analysis | Richard E. Bills, Neil Judell, James P. McNiven | 2016-11-08 |
| 9110033 | Front quartersphere scattered light analysis | Richard E. Bills, Neil Judell, James P. McNiven | 2015-08-18 |
| 8797537 | Interferometer with a virtual reference surface | — | 2014-08-05 |
| 8330947 | Back quartersphere scattered light analysis | Richard E. Bills, Neil Judell, James P. McNiven | 2012-12-11 |
| 7605913 | System and method for inspecting a workpiece surface by analyzing scattered light in a front quartersphere region above the workpiece | Richard E. Bills, Neil Judell, James P. McNiven | 2009-10-20 |
| 7583386 | Method and apparatus for optically analyzing a surface | Shouhong Tang | 2009-09-01 |
| 7428056 | Method and apparatus for optically analyzing a surface | Shouhong Tang | 2008-09-23 |
| 7408649 | Method and apparatus for optically analyzing a surface | Shouhong Tang | 2008-08-05 |
| 6847458 | Method and apparatus for measuring the shape and thickness variation of polished opaque plates | Shouhong Tang | 2005-01-25 |
| 6844929 | Apparatus and method for holding and transporting thin opaque plates | Joe Glenn, Clive M. Pridmore, Bryan G. Castner | 2005-01-18 |
| 6184994 | Method and apparatus for absolutely measuring flat and sperical surfaces with high spatal resolution | — | 2001-02-06 |
| 6061133 | Interferometer light source | — | 2000-05-09 |
| 5737081 | Extended-source low coherence interferometer for flatness testing | — | 1998-04-07 |
| 5357341 | Method for evaluating interferograms and interferometer therefor | Michael Kuchel, Karl-Heinz Schuster | 1994-10-18 |
| 5311599 | Method and apparatus for optical testing of samples | — | 1994-05-10 |
| 5185810 | Method for optical testing of samples | — | 1993-02-09 |
| 5042041 | Radiation source for partially coherent radiation | Uwe Vry, Michael Kuchel, Andreas Dorsel | 1991-08-20 |