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Roy E. Mallory — 14 Patents

ADAde: 12 patents #3 of 59Top 6%
Kla-Tencor: 1 patents #1,241 of 2,049Top 65%
Overall (All Time): #332,869 of 4,157,543Top 9%
14 Patents All Time
Roy E. Mallory has been granted 14 US patents while listed as an inventor at Ade. The first was granted in 1984 and the most recent in December 2009. Roy E. Mallory ranks #332,869 of 4,157,543 US inventors in our database (top 8.0%). Patent records list Roy E. Mallory in Bedford, MA, GB.

Issued Patents All Time

Showing 1–14 of 14 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
7629798 Wafer edge-defect detection and capacitive probe therefor Jaydeep Sinha, Stephen MacLeod 2009-12-08 $25,459,000
7114399 Shaped non-contact capacitive displacement sensors for measuring shaped targets 2006-10-03 $4,200,000
6714023 Method for high-accuracy non-contact capacitive displacement measurement of poorly connected targets 2004-03-30
6560555 Method for facilitating the field replacement of sensors 2003-05-06 $2,173,000
6556941 Separation of periodic and non-periodic signal components Neil Judell 2003-04-29 $1,930,000
6476621 Self-bootstrapping transducer interface 2002-11-05 $1,901,000
6400162 Capacitive displacement sensor for measuring thin targets Richard Carter 2002-06-04 $2,117,000
6181142 Nonlinear current mirror for loop-gain control 2001-01-30 $3,888,000
5786698 Transducer Bootstrapping apparatus 1998-07-28 $2,277,000
5708368 Method and apparatus for emulation of a linear variable differential transducer by a capacitive gaging system 1998-01-13 $2,767,000
5642298 Wafer testing and self-calibration system Peter L. Domenicali, Noel S. Poduje, Alexander Belyaev, Peter A. Harvey, Richard Scott Smith 1997-06-24 $3,936,000
4958129 Prealigner probe Noel S. Poduje 1990-09-18
4646009 Contacts for conductivity-type sensors 1987-02-24
4457664 Wafer alignment station Neil Judell, Robert C. Abbe, Noel S. Poduje 1984-07-03