Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7629798 | Wafer edge-defect detection and capacitive probe therefor | Jaydeep Sinha, Stephen MacLeod | 2009-12-08 |
| 7114399 | Shaped non-contact capacitive displacement sensors for measuring shaped targets | — | 2006-10-03 |
| 6714023 | Method for high-accuracy non-contact capacitive displacement measurement of poorly connected targets | — | 2004-03-30 |
| 6560555 | Method for facilitating the field replacement of sensors | — | 2003-05-06 |
| 6556941 | Separation of periodic and non-periodic signal components | Neil Judell | 2003-04-29 |
| 6476621 | Self-bootstrapping transducer interface | — | 2002-11-05 |
| 6400162 | Capacitive displacement sensor for measuring thin targets | Richard Carter | 2002-06-04 |
| 6181142 | Nonlinear current mirror for loop-gain control | — | 2001-01-30 |
| 5786698 | Transducer Bootstrapping apparatus | — | 1998-07-28 |
| 5708368 | Method and apparatus for emulation of a linear variable differential transducer by a capacitive gaging system | — | 1998-01-13 |
| 5642298 | Wafer testing and self-calibration system | Peter L. Domenicali, Noel S. Poduje, Alexander Belyaev, Peter A. Harvey, Richard Scott Smith | 1997-06-24 |
| 4958129 | Prealigner probe | Noel S. Poduje | 1990-09-18 |
| 4646009 | Contacts for conductivity-type sensors | — | 1987-02-24 |
| 4457664 | Wafer alignment station | Neil Judell, Robert C. Abbe, Noel S. Poduje | 1984-07-03 |