PD

Peter L. Domenicali

CI Cambridge Research & Instrumentation: 5 patents #6 of 17Top 40%
SE Semitest: 3 patents #2 of 11Top 20%
AD Ade: 2 patents #15 of 59Top 30%
ZY Zygo: 2 patents #34 of 99Top 35%
OM Obp Medical: 1 patents #10 of 13Top 80%
OS Obp Surgical: 1 patents #5 of 7Top 75%
CO Coopersurgical: 1 patents #52 of 104Top 50%
KA Karl Suss America: 1 patents #5 of 14Top 40%
📍 Prescott Valley, AZ: #5 of 71 inventorsTop 8%
🗺 Arizona: #2,162 of 32,909 inventorsTop 7%
Overall (All Time): #283,435 of 4,157,543Top 7%
16
Patents All Time

Issued Patents All Time

Showing 1–16 of 16 patents

Patent #TitleCo-InventorsDate
12246124 Illuminated suction device Jeffrey Ralph Swift, Adrienne Clark, Jason Swift, Matthew C. Traub 2025-03-11
11806111 Systems and methods for in-vivo optical imaging and measurement Clifford C. Hoyt 2023-11-07
11617822 Illuminated suction device Jeffrey Ralph Swift, Adrienne Clark, Jason Swift, Matthew C. Traub 2023-04-04
10959609 Illuminated suction device Jeffrey Ralph Swift, Adrienne Clark, Jason Swift, Matthew C. Traub 2021-03-30
8330087 Spectral imaging system with dynamic optical correction 2012-12-11
8103331 Systems and methods for in-vivo optical imaging and measurement Clifford C. Hoyt 2012-01-24
7990545 Surface measurement of in-vivo subjects using spot projector Clifford C. Hoyt, Peter J. Miller 2011-08-02
7782470 Surface measurement apparatus and method using depth of field Clifford C. Hoyt, Scott Determan, Peter J. Miller 2010-08-24
6163163 Semiconductor material characterizing method and apparatus Charles M. Kohn, Martin Rommel, Sergey Liberman, Alan H. Field, Glendon P. Marston 2000-12-19
6097205 Method and apparatus for characterizing a specimen of semiconductor material Sergey Liberman, Alan H. Field, Charles M. Kohn, Glendon P. Marston 2000-08-01
6034535 Method utilizing a modulated light beam for determining characteristics such as the doping concentration profile of a specimen of semiconductor material Sergey Liberman, Alan H. Field, Charles M. Kohn, Glendon P. Marston 2000-03-07
5721616 Tilt free micromotion translator 1998-02-24
5642298 Wafer testing and self-calibration system Roy E. Mallory, Noel S. Poduje, Alexander Belyaev, Peter A. Harvey, Richard Scott Smith 1997-06-24
5511005 Wafer handling and processing system Robert C. Abbe, Noel S. Poduje, Randal K. Goodall 1996-04-23
5204739 Proximity mask alignment using a stored video image 1993-04-20
4201473 Optical interferometer system with CCTV camera for measuring a wide range of aperture sizes George C. Hunter 1980-05-06