Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7629798 | Wafer edge-defect detection and capacitive probe therefor | Roy E. Mallory, Jaydeep Sinha | 2009-12-08 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7629798 | Wafer edge-defect detection and capacitive probe therefor | Roy E. Mallory, Jaydeep Sinha | 2009-12-08 |