Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10215713 | Determining a configuration for an optical element positioned in a collection aperture during wafer inspection | Pavel Kolchin, Mikhail Haurylau, Dan Kapp, Robert M. Danen, Grace Hsiu-Ling Chen | 2019-02-26 |
| 10082470 | Defect marking for semiconductor wafer inspection | David W. Shortt, Steven R. Lange, Daniel L. Kapp, Charles Amsden | 2018-09-25 |
| 9709510 | Determining a configuration for an optical element positioned in a collection aperture during wafer inspection | Pavel Kolchin, Mikhail Haurylau, Dan Kapp, Robert M. Danen, Grace Hsiu-Ling Chen | 2017-07-18 |