Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10215707 | System for inspecting a backside of a wafer | Zehava Ben Ezer, Guy Kafry, Shimon Koren, Natan Deutsch | 2019-02-26 |
| 9756313 | High throughput and low cost height triangulation system and method | Shimon Koren, Menachem Regensburger, Uri Weinar | 2017-09-05 |
| 8731274 | Method and system for wafer registration | Shimon Koren | 2014-05-20 |