Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12315206 | Inspection system for edge and bevel inspection of semiconductor structures | Carmel Yehuda Drillman, Mordi Dahan, Moshe Edri, Ohad Shimon, Gil Perlberg | 2025-05-27 |
| 11927545 | Semiconductor edge and bevel inspection tool system | Carmel Yehuda Drillman, Mordi Dahan, Moshe Edri, Ohad Shimon | 2024-03-12 |
| 10598607 | Objective lens | Zehava Ben Ezer, Menachem Regensburger, Tomer Gilad, Shy Shapira | 2020-03-24 |
| 10497092 | Continuous light inspection | Menachem Regensburger, Zehava Ben-Ezer | 2019-12-03 |
| 10222517 | Aperture stop | Tomer Gilad | 2019-03-05 |
| 10215707 | System for inspecting a backside of a wafer | Zehava Ben Ezer, Guy Kafry, Eldad Langmans, Natan Deutsch | 2019-02-26 |
| 9759555 | High throughput triangulation system | Tomer Gilad | 2017-09-12 |
| 9756313 | High throughput and low cost height triangulation system and method | Eldad Langmans, Menachem Regensburger, Uri Weinar | 2017-09-05 |
| 9418413 | System and a method for automatic recipe validation and selection | Or Shur | 2016-08-16 |
| 9147102 | Method and system for measuring bumps based on phase and amplitude information | Or Shur, Yacov Malinovich, Gilad Golan | 2015-09-29 |
| 8731274 | Method and system for wafer registration | Eldad Langmans | 2014-05-20 |
| 8699784 | Inspection recipe generation and inspection based on an inspection recipe | Eldad Langmatz, Menachem Regensburger, Zehava Ben-Ezer | 2014-04-15 |