Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12320757 | Semiconductor inspection tool system and method for wafer edge inspection | Carmel Yehuda Drillman, Moshe Edri, Menachem Regensburger, Baheej Bathish | 2025-06-03 |
| 12315206 | Inspection system for edge and bevel inspection of semiconductor structures | Carmel Yehuda Drillman, Moshe Edri, Ohad Shimon, Shimon Koren, Gil Perlberg | 2025-05-27 |
| 11927545 | Semiconductor edge and bevel inspection tool system | Carmel Yehuda Drillman, Moshe Edri, Ohad Shimon, Shimon Koren | 2024-03-12 |
| 11828713 | Semiconductor inspection tool system and method for wafer edge inspection | Carmel Yehuda Drillman, Moshe Edri, Menachem Regensburger, Baheej Bathish | 2023-11-28 |