Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 12320757 | Semiconductor inspection tool system and method for wafer edge inspection | Carmel Yehuda Drillman, Moshe Edri, Menachem Regensburger, Mordi Dahan | 2025-06-03 | |
| 11828713 | Semiconductor inspection tool system and method for wafer edge inspection | Carmel Yehuda Drillman, Moshe Edri, Menachem Regensburger, Mordi Dahan | 2023-11-28 | $27,958,000 |