Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12320757 | Semiconductor inspection tool system and method for wafer edge inspection | Carmel Yehuda Drillman, Moshe Edri, Menachem Regensburger, Mordi Dahan | 2025-06-03 |
| 11828713 | Semiconductor inspection tool system and method for wafer edge inspection | Carmel Yehuda Drillman, Moshe Edri, Menachem Regensburger, Mordi Dahan | 2023-11-28 |