Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12315206 | Inspection system for edge and bevel inspection of semiconductor structures | Carmel Yehuda Drillman, Mordi Dahan, Moshe Edri, Shimon Koren, Gil Perlberg | 2025-05-27 |
| 11927545 | Semiconductor edge and bevel inspection tool system | Carmel Yehuda Drillman, Mordi Dahan, Moshe Edri, Shimon Koren | 2024-03-12 |