Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12332176 | Dark field illumination based on laser illuminated phosphor | Amnon Menachem, Yuval Weissler | 2025-06-17 |
| 11682584 | Measuring buried layers | — | 2023-06-20 |
| 11055836 | Optical contrast enhancement for defect inspection | — | 2021-07-06 |
| 10598607 | Objective lens | Menachem Regensburger, Shimon Koren, Tomer Gilad, Shy Shapira | 2020-03-24 |
| 10215707 | System for inspecting a backside of a wafer | Guy Kafry, Shimon Koren, Eldad Langmans, Natan Deutsch | 2019-02-26 |
| 10197505 | Method and system for low cost inspection | Ophir Peleg | 2019-02-05 |