KO

Katsuya Okumura

KT Kabushiki Kaisha Toshiba: 243 patents #9 of 21,451Top 1%
TL Tokyo Electron Limited: 32 patents #115 of 5,567Top 3%
EB Ebara: 30 patents #55 of 1,611Top 4%
OC Octec: 23 patents #1 of 42Top 3%
IBM: 7 patents #14,640 of 70,183Top 25%
TO Toshiba: 7 patents #92 of 2,688Top 4%
TO Tomoegawa: 6 patents #7 of 108Top 7%
CK Ckd: 5 patents #43 of 332Top 15%
FC Fuji Electric Co.: 5 patents #458 of 2,643Top 20%
JS Jsr: 5 patents #221 of 1,137Top 20%
IC Ibiden Co.: 4 patents #206 of 730Top 30%
Kyocera: 3 patents #999 of 3,732Top 30%
SA Siemens Aktiengesellschaft: 3 patents #4,667 of 22,248Top 25%
TS Tokyo Electron Sagami: 3 patents #10 of 81Top 15%
NC Nicca Chemical Co.: 2 patents #18 of 106Top 20%
Sharp Kabushiki Kaisha: 2 patents #5,184 of 10,731Top 50%
SC Shin-Etsu Chemical Co.: 1 patents #1,340 of 2,176Top 65%
Sumitomo Electric Industries: 1 patents #13,249 of 21,551Top 65%
TL Tokyo Electron Kyushu Limited: 1 patents #67 of 104Top 65%
SH Shimadzu: 1 patents #1,152 of 2,007Top 60%
SC Screen Holdings Co.: 1 patents #452 of 686Top 70%
TK Tokyo Kogaku Kikai: 1 patents #65 of 143Top 50%
YE Yaskawa Electric: 1 patents #557 of 1,006Top 60%
SC Sanko Co.: 1 patents #11 of 45Top 25%
Toshiba Memory: 1 patents #1,210 of 1,971Top 65%
TT Toudai Tlo: 1 patents #31 of 79Top 40%
UK Ushio Denki Kabushiki Kaisha: 1 patents #309 of 583Top 55%
HK Hamamatsu Photonics K.K.: 1 patents #936 of 1,436Top 70%
📍 Tokyo, NY: #1 of 99 inventorsTop 2%
Overall (All Time): #1,341 of 4,157,543Top 1%
296
Patents All Time

Issued Patents All Time

Showing 276–296 of 296 patents

Patent #TitleCo-InventorsDate
4912963 Method and an apparatus for evaluating the gas purifying ability of a gas purifier Kazuya Mori, Tohru Watanabe 1990-04-03
4914056 Method of manufacturing a semiconductor device having tapered pillars 1990-04-03
4912052 Method of testing semiconductor elements Motosuke Miyoshi 1990-03-27
4910398 Pattern Measurement method Fumio Komatsu 1990-03-20
4902131 Surface inspection method and apparatus therefor Yuichiro Yamazaki, Motosuke Miyoshi, Shigeru Ogawa 1990-02-20
4891560 Magnetron plasma apparatus with concentric magnetic means Atsumu Tezaki 1990-01-02
4890029 Electron beam apparatus including plurality of ion pump blocks Motosuke Miyoshi 1989-12-26
4875088 Semiconductor device having a backplate electrode Hidemitsu Egawa, Riichirou Aoki 1989-10-17
4823182 Semiconductor device with a diffusion barrier contact of a refractory metal nitride and either carbon or boron 1989-04-18
4807021 Semiconductor device having stacking structure 1989-02-21
4807159 Apparatus and method for controlling irradiation of an electron beam at a fixed position in an electron beam tester system Fumio Komatsu, Motosuke Miyoshi 1989-02-21
4800268 Method and apparatus for scanning a laser beam to examine the surface of semiconductor wafer Motosuke Miyoshi, Shigeru Ogawa 1989-01-24
4787800 Transfer machine in a surface inspection apparatus Kazuyoshi Sone, Tomio Nakajima, Kanji Ikegaya 1988-11-29
4678114 Method of wire bonding with applied insulative coating Hideharu Egawa 1987-07-07
4583861 Surface condition judging apparatus Hiroshi Yamaji, Shigeru Ogawa 1986-04-22
4567364 Method and apparatus for measuring dimension of secondary electron emission object Masaaki Kano, Hiroshi Yamaji, Shinji Nakao 1986-01-28
4562455 Semiconductor element Motosuke Miyoshi 1985-12-31
4538344 Method of forming electrode/wiring layer Masaaki Ueda 1985-09-03
4502210 Method for manufacturing semiconductor device Toshinori Shinki, Takashi Sato, Masaaki Ueda 1985-03-05
4488674 Bonding wire, semiconductor device having the same, and bonding method using the same Hideharu Egawa 1984-12-18
4468313 Sputtering target Masaaki Ueda 1984-08-28