HY

Hiroshi Yamaji

Fujitsu Limited: 7 patents #4,529 of 24,456Top 20%
KC Kansai Chemical Engineering Co.: 3 patents #9 of 46Top 20%
TO Toshiba: 2 patents #606 of 2,688Top 25%
KT Kabushiki Kaisha Toshiba: 1 patents #13,537 of 21,451Top 65%
MM Mitsubishi Mining: 1 patents #886 of 2,247Top 40%
Sumitomo Electric Industries: 1 patents #13,249 of 21,551Top 65%
Overall (All Time): #301,105 of 4,157,543Top 8%
16
Patents All Time

Issued Patents All Time

Showing 1–16 of 16 patents

Patent #TitleCo-InventorsDate
10463984 Evaporator Tadahiro MUKAIDA, Hideo Noda 2019-11-05
10434437 Evaporation device Tadahiro MUKAIDA, Hideo Noda 2019-10-08
7846303 Multi-structure internal heat exchange type distillation tower Hideo Noda, Nobuyuki Kuratani, Kunio Kataoka 2010-12-07
7097394 Circuit board production method and circuit board production data Toshihiro Nishii, Tadao Kimura 2006-08-29
6341889 Method for distributing liquid by controlling rotation speed of a shaft as a function of the liquid depth in a tank Hideo Noda, Takaya Inoue 2002-01-29
5711587 Cover mounting structure for shelf assembly Tetsuya Takahashi, Hisao Hayashi, Shigeru Amagasa, Takashi Sato, Tsutomu Takahashi +2 more 1998-01-27
5602723 Subrack device Tsutomu Takahashi, Hisao Hayashi, Shigeru Amagasa, Takashi Sato, Tomoyuki Hongoh +5 more 1997-02-11
5398748 Heat pipe connector and electronic apparatus and radiating fins having such connector Tomoyuki Hongoh, Takashi Sato, Tsutomu Takahashi, Riichi Magome 1995-03-21
5273463 Test connector for electronic circuit units Mitsuo Kaetsu, Kiyoshi Minematsu, Tomoyuki Hongoh 1993-12-28
5262922 Heat radiation structure for semiconductor device Takashi Kanno, Takashi Sato, Riichi Magome, Tomoyuki Hongho 1993-11-16
5253320 Optical fiber cable lead-in structure Tetsuya Takahashi, Sataroh Sawano, Tomoyuki Hongoh, Hiroshi Kadoya 1993-10-12
4823235 Earth connection device in metal core printed circuit board Mitsuaki Suzuki, Katsuyuki Arai, Yasushi Kojima, Mitsusada Toyama, Jun Sakiura +1 more 1989-04-18
4747734 Profiling apparatus Kensuke Ide 1988-05-31
4626101 Surface defect inspecting apparatus Shigeru Ogawa, Masaaki Kano 1986-12-02
4583861 Surface condition judging apparatus Shigeru Ogawa, Katsuya Okumura 1986-04-22
4567364 Method and apparatus for measuring dimension of secondary electron emission object Masaaki Kano, Shinji Nakao, Katsuya Okumura 1986-01-28