Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12255041 | Electron microscope and method of correcting aberration | Keito Aibara, Shigeyuki Morishita, Motofumi Saito, Ryusuke Sagawa, Fuminori Uematsu | 2025-03-18 |
| 11842880 | Estimation model generation method and electron microscope | Ryusuke Sagawa, Shigeyuki Morishita, Fuminori Uematsu, Keito Aibara | 2023-12-12 |
| 11764029 | Method of measuring aberration and electron microscope | Shigeyuki Morishita, Ryusuke Sagawa, Fuminori Uematsu, Keito Aibara | 2023-09-19 |
| 11222764 | Charged particle beam device and control method of optical system of charged particle beam device | Kazuya Yamazaki, Yuko Shimizu, Hirofumi Iijima, Takuma Fukumura, Naoki Hosogi | 2022-01-11 |
| 10720302 | Electron microscope | Shigeyuki Morishita, Takeo Sasaki | 2020-07-21 |