Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11222764 | Charged particle beam device and control method of optical system of charged particle beam device | Kazuya Yamazaki, Yuko Shimizu, Hirofumi Iijima, Takuma Fukumura, Tomohiro Nakamichi | 2022-01-11 |
| 10741358 | Electron microscope | Yuko Shimizu, Hirofumi Iijima, Jun Yamashita | 2020-08-11 |
| 10541107 | Three-dimensional image reconstruction method, image processor, and transmission electron microscope, using image obtained by tilted electron beam conditions | Yoshinori Fujiyoshi, Isamu Ishikawa | 2020-01-21 |
| 10014156 | Calibration method and charged particle beam system | — | 2018-07-03 |