Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11309161 | Charged particle beam apparatus and adjustment method for charged particle beam apparatus | — | 2022-04-19 |
| 11222764 | Charged particle beam device and control method of optical system of charged particle beam device | Yuko Shimizu, Hirofumi Iijima, Takuma Fukumura, Naoki Hosogi, Tomohiro Nakamichi | 2022-01-11 |
| 10332720 | Charged particle system and method for measuring deflection fields in a sample | — | 2019-06-25 |
| 10020162 | Beam alignment method and electron microscope | Yuko Shimizu, Akira Yasuhara, Fumio Hosokawa | 2018-07-10 |
| 9773639 | Electron microscope | — | 2017-09-26 |
| 9595416 | Transmission electron microscope | — | 2017-03-14 |
| 8772714 | Transmission electron microscope and method of observing TEM images | — | 2014-07-08 |
| 8657540 | Cutting insert | Kenji Sugawara | 2014-02-25 |
| 8604445 | Method of evacuating sample holder, pumping system, and electron microscope | — | 2013-12-10 |
| 8585330 | Cutting insert | Kenji Sugawara | 2013-11-19 |
| 6312201 | Interference fit type cutting tool | Hidehiko Nagaya, Hiroshi Shimomura, Masayuki Okawa, Takamasa Shimano | 2001-11-06 |
| 6126365 | Boring tool | Masayuki Okawa, Hidehiko Nagaya, Yoichi Ishikawa | 2000-10-03 |
| 4882559 | Permanent magnet type demagnetizing head | Noboru Koizumi | 1989-11-21 |