Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10020162 | Beam alignment method and electron microscope | Yuko Shimizu, Akira Yasuhara, Kazuya Yamazaki | 2018-07-10 |
| 8952339 | Chromatic aberration corrector and method of controlling same | — | 2015-02-10 |
| 8785880 | Chromatic aberration corrector and electron microscope | Hidetaka Sawada | 2014-07-22 |
| 8664599 | Electron microscope | — | 2014-03-04 |
| 8178850 | Chromatic aberration corrector for charged-particle beam system and correction method therefor | Hidetaka Sawada | 2012-05-15 |
| 7763862 | Method of aberration correction and electron beam system | — | 2010-07-27 |
| 7598496 | Charged-particle beam system | Hidetaka Sawada | 2009-10-06 |
| 7420179 | Electron microscope | — | 2008-09-02 |
| 7060985 | Multipole field-producing apparatus in charged-particle optical system and aberration corrector | — | 2006-06-13 |
| 6924488 | Charged-particle beam apparatus equipped with aberration corrector | Miyuki Matsuya | 2005-08-02 |
| 6836373 | Spherical aberration corrector for electron microscope | — | 2004-12-28 |
| 6744048 | Lens system for phase plate for transmission electron microscope and transmission electron microscope | Kuniaki Nagayama, Radostin Stoyanov Danev | 2004-06-01 |
| 6555818 | Transmission electron microscope | — | 2003-04-29 |
| 6548816 | Stigmator assembly | — | 2003-04-15 |
| 6448555 | Electron microscope and similar instruments | — | 2002-09-10 |