Issued Patents All Time
Showing 1–21 of 21 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12354827 | Aberration correcting device and electron microscope | Shigeyuki Morishita | 2025-07-08 |
| 10720301 | Aberration corrector and electron microscope | — | 2020-07-21 |
| 10541111 | Distortion measurement method for electron microscope image, electron microscope, distortion measurement specimen, and method of manufacturing distortion measurement specimen | Yuji Konyuba, Kazuya Omoto | 2020-01-21 |
| 9997327 | Liner tube and electron microscope | Yu Jimbo, Masashi Shimizu | 2018-06-12 |
| 9859095 | Electron microscope and measurement method | Naoya Shibata, Yuji Kohno | 2018-01-02 |
| 9793088 | Two-stage dodecapole aberration corrector for charged-particle beam | Yukihito Kondoh | 2017-10-17 |
| 9349565 | Multipole lens, aberration corrector, and electron microscope | — | 2016-05-24 |
| 9256068 | Spherical aberration corrector, method of spherical aberration correction, and charged particle beam instrument | Yu Jimbo | 2016-02-09 |
| 8907298 | Method for axial alignment of charged particle beam and charged particle beam system | Takeo Sasaki | 2014-12-09 |
| 8847172 | Method for axial alignment of charged particle beam and charged particle beam system | Takeo Sasaki | 2014-09-30 |
| 8785880 | Chromatic aberration corrector and electron microscope | Fumio Hosokawa | 2014-07-22 |
| 8541755 | Electron microscope | — | 2013-09-24 |
| 8431897 | Transmission electron microscope | Naoya Shibata, Wataru Inami | 2013-04-30 |
| 8389951 | Spherical aberration corrector and method of spherical aberration correction | — | 2013-03-05 |
| 8178850 | Chromatic aberration corrector for charged-particle beam system and correction method therefor | Fumio Hosokawa | 2012-05-15 |
| 8168956 | Scanning transmission electron microscope and method of aberration correction therefor | — | 2012-05-01 |
| 7723683 | Aberration correction system | — | 2010-05-25 |
| 7619220 | Method of measuring aberrations and correcting aberrations using Ronchigram and electron microscope | Takumi Sannomiya | 2009-11-17 |
| 7598496 | Charged-particle beam system | Fumio Hosokawa | 2009-10-06 |
| 5250117 | Degreasing-cleaning method | Takashi Hirano, Shoichi Momose, Shiro Inoue, Kazunori Koba, Masayuki Isaka | 1993-10-05 |
| 5250183 | Apparatus for manufacturing ultra-pure water | Shoichi Momose, Shiro Inoue, Hideo Suematsu, Kazunori Koba | 1993-10-05 |