Issued Patents All Time
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11508550 | Method and apparatus for image processing | — | 2022-11-22 |
| 11462384 | Method of acquiring dark-field image | — | 2022-10-04 |
| 11456151 | Image acquisition method and electron microscope | — | 2022-09-27 |
| 11251013 | Deflector and charged particle beam system | — | 2022-02-15 |
| 11251016 | Method of controlling transmission electron microscope and transmission electron microscope | — | 2022-02-15 |
| 11031208 | Cold cathode field-emission electron gun, adjustment method for cold cathode field-emission electron gun, sharpening method for emitter, and electron microscope | — | 2021-06-08 |
| 10886099 | Method of aberration measurement and electron microscope | Akiho Nakamura | 2021-01-05 |
| 10840058 | Aberration measurement method and electron microscope | Akiho Nakamura | 2020-11-17 |
| 10714308 | Measurement method and electron microscope | — | 2020-07-14 |
| 10224173 | Objective lens and transmission electron microscope | Tatsuo Naruse | 2019-03-05 |
| 10014153 | Electron microscope and method of aberration measurement | — | 2018-07-03 |
| 9859095 | Electron microscope and measurement method | Naoya Shibata, Hidetaka Sawada | 2018-01-02 |
| 9779911 | Electron microscope and method of measuring aberrations | — | 2017-10-03 |
| 9728372 | Measurement method and electron microscope | — | 2017-08-08 |
| 9576768 | Multipole lens and charged particle beam system | — | 2017-02-21 |
| 9396904 | Multipole lens, method of fabricating same, and charged particle beam system | Norikazu Arima | 2016-07-19 |
| 8859964 | Electron microscope and method of adjusting the same | — | 2014-10-14 |
| 5181071 | Apparatus for evaluating characteristics of photosensitive drum for electrophotography | Satoshi Nakajima, Kouichi Mochizuki, Hiroki Kobayashi | 1993-01-19 |