Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7683320 | Transmission electron microscope | Yukihito Kondo | 2010-03-23 |
| 7619220 | Method of measuring aberrations and correcting aberrations using Ronchigram and electron microscope | Hidetaka Sawada | 2009-11-17 |