Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12354827 | Aberration correcting device and electron microscope | Hidetaka Sawada | 2025-07-08 |
| 12255041 | Electron microscope and method of correcting aberration | Keito Aibara, Tomohiro Nakamichi, Motofumi Saito, Ryusuke Sagawa, Fuminori Uematsu | 2025-03-18 |
| 11842880 | Estimation model generation method and electron microscope | Ryusuke Sagawa, Fuminori Uematsu, Tomohiro Nakamichi, Keito Aibara | 2023-12-12 |
| 11764029 | Method of measuring aberration and electron microscope | Ryusuke Sagawa, Fuminori Uematsu, Tomohiro Nakamichi, Keito Aibara | 2023-09-19 |
| 11087951 | Scanning transmission electron microscope and aberration correction method | Izuru Chiyo | 2021-08-10 |
| 10755888 | Aberration corrector and charged particle beam device | — | 2020-08-25 |
| 10720302 | Electron microscope | Takeo Sasaki, Tomohiro Nakamichi | 2020-07-21 |
| 10446362 | Distortion correction method and electron microscope | — | 2019-10-15 |
| 10332721 | Aberration computing device, aberration computing method, image processor, image processing method, and electron microscope | — | 2019-06-25 |
| 10332719 | Device and method for computing angular range for measurement of aberrations and electron microscope | — | 2019-06-25 |
| 10014152 | Method of aberration correction and charged particle beam system | — | 2018-07-03 |
| 9892886 | Charged particle beam system and method of aberration correction | — | 2018-02-13 |