Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12255041 | Electron microscope and method of correcting aberration | Keito Aibara, Tomohiro Nakamichi, Shigeyuki Morishita, Ryusuke Sagawa, Fuminori Uematsu | 2025-03-18 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12255041 | Electron microscope and method of correcting aberration | Keito Aibara, Tomohiro Nakamichi, Shigeyuki Morishita, Ryusuke Sagawa, Fuminori Uematsu | 2025-03-18 |