Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12255041 | Electron microscope and method of correcting aberration | Keito Aibara, Tomohiro Nakamichi, Shigeyuki Morishita, Motofumi Saito, Ryusuke Sagawa | 2025-03-18 |
| 11842880 | Estimation model generation method and electron microscope | Ryusuke Sagawa, Shigeyuki Morishita, Tomohiro Nakamichi, Keito Aibara | 2023-12-12 |
| 11788976 | X-ray measurement apparatus and X-ray measurement method | Takanori Murano | 2023-10-17 |
| 11764029 | Method of measuring aberration and electron microscope | Shigeyuki Morishita, Ryusuke Sagawa, Tomohiro Nakamichi, Keito Aibara | 2023-09-19 |
| 11222241 | Charged particle beam apparatus and machine learning method | — | 2022-01-11 |
| 11211150 | Mass spectrum processing apparatus and model generation method | Takaya Satoh, Masahiko Takei | 2021-12-28 |