Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12255041 | Electron microscope and method of correcting aberration | Tomohiro Nakamichi, Shigeyuki Morishita, Motofumi Saito, Ryusuke Sagawa, Fuminori Uematsu | 2025-03-18 |
| 11842880 | Estimation model generation method and electron microscope | Ryusuke Sagawa, Shigeyuki Morishita, Fuminori Uematsu, Tomohiro Nakamichi | 2023-12-12 |
| 11764029 | Method of measuring aberration and electron microscope | Shigeyuki Morishita, Ryusuke Sagawa, Fuminori Uematsu, Tomohiro Nakamichi | 2023-09-19 |