Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11788976 | X-ray measurement apparatus and X-ray measurement method | Fuminori Uematsu | 2023-10-17 |
| 11699567 | X-ray detection apparatus and method | — | 2023-07-11 |
| 11674913 | Sample analysis apparatus and method | Takaomi Yokoyama | 2023-06-13 |
| 11668662 | Sample analysis apparatus and method | Yasuaki Yamamoto | 2023-06-06 |
| 11536675 | Analytical method and apparatus | — | 2022-12-27 |
| 11353414 | Analysis device and spectrum generation method | — | 2022-06-07 |
| 11131638 | Calibration method and analysis device | — | 2021-09-28 |
| 10739284 | X-ray analyzer and spectrum generation method | — | 2020-08-11 |
| 8421007 | X-ray detection system | Masami Terauchi, Nobuo Handa, Hideyuki Takahashi | 2013-04-16 |