Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9793088 | Two-stage dodecapole aberration corrector for charged-particle beam | Hidetaka Sawada | 2017-10-17 |
| 7566884 | Specimen holder for electron microscope | Shunji Deguchi | 2009-07-28 |