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Kent B. Erington, Daniel J. Bodoh, Keith Serrels |
2021-06-29 |
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High frequency lock-in thermography using single photon detectors |
Euan Ramsay |
2020-09-08 |
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Synchronized pulsed LADA for the simultaneous acquisition of timing diagrams and laser-induced upsets |
Kent B. Erington, Daniel J. Bodoh, Keith Serrels |
2019-01-29 |
| 7884024 |
Apparatus and method for optical interference fringe based integrated circuit processing |
Erwan Le Roy, Chun-Cheng Tsao, Rajesh Jain |
2011-02-08 |
| 7883630 |
FIB milling of copper over organic dielectrics |
Vladimir Makarov |
2011-02-08 |
| 7842920 |
Methods and systems of performing device failure analysis, electrical characterization and physical characterization |
— |
2010-11-30 |
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FIB based open via analysis and repair |
Ketan Shah, Tamayasu Anayama, Mark Andrew Thompson |
2010-08-31 |
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Apparatus and method for optical interference fringe based integrated circuit processing |
Erwan Le Roy, Chun-Cheng Tsao |
2010-04-13 |
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2009-05-05 |
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Apparatus and method of forming silicide in a localized manner |
Christian Boit, Chun-Cheng Tsao, Uwe Kerst, Stephan Schoemann, Peter Sadewater |
2008-10-21 |
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Sub-resolution alignment of images |
Madhumita Sengupta, Mamta Slnha, William Henry Thompson |
2008-08-05 |
| 7400154 |
Apparatus and method for detecting photon emissions from transistors |
Romain Desplats, Philippe Perdu, Ketan Shah |
2008-07-15 |
| 7135678 |
Charged particle guide |
Qinsong Steve Wang, Tzong-Tsong Miau |
2006-11-14 |
| 7135123 |
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Mark Thompson, Erwan Le Roy, William B. Thompson, Catherine Kardach |
2006-11-14 |
| 7115426 |
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Erwan Le Roy, Patricia Le Coupanec, William B. Thompson, Mark Thompson, Lokesh Johri |
2006-10-03 |
| 7060196 |
FIB milling of copper over organic dielectrics |
Vladimir Makarov |
2006-06-13 |
| 7036109 |
Imaging integrated circuits with focused ion beam |
Chun-Cheng Tsao, William B. Thompson, Erwan Le Roy, Eugene A. Delenia |
2006-04-25 |
| 6943572 |
Apparatus and method for detecting photon emissions from transistors |
Romain Desplats, Philippe Perdu, Ketan Shah |
2005-09-13 |
| 6905623 |
Precise, in-situ endpoint detection for charged particle beam processing |
Kenneth Wilsher |
2005-06-14 |
| 6872581 |
Measuring back-side voltage of an integrated circuit |
Christopher Shaw, Chun-Cheng Tsao |
2005-03-29 |
| 6848087 |
Sub-resolution alignment of images |
Madhumita Sengupta, Mamta Sinha, William Henry Thompson |
2005-01-25 |
| 5905266 |
Charged particle beam system with optical microscope |
Xavier Larduinat, James Henry Brown |
1999-05-18 |
| 5840630 |
FBI etching enhanced with 1,2 di-iodo-ethane |
Michael A. Cecere |
1998-11-24 |
