Issued Patents All Time
Showing 1–20 of 20 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12056894 | Method for imaging a region of interest of a sample using a tomographic X-ray microscope, microscope, system and computer program | Susan Candell, Naomi Kotwal, Allen Gu, Lorenz Lechner, Wayne Broderick | 2024-08-06 |
| 12035451 | Method and system for liquid cooling isolated x-ray transmission target | Claus Flachenecker, Bruce Borchers | 2024-07-09 |
| 12007339 | Sample holder, system and method | Susan Candell, Naomi Kotwal, Allen Gu, Zheren Wu, Wayne Broderick | 2024-06-11 |
| 11864300 | X-ray source with liquid cooled source coils | Claus Flachenecker | 2024-01-02 |
| 11817231 | Detection system for X-ray inspection of an object | Johannes Ruoff, Juan Atkinson Mora, Heiko Feldmann, Christoph Graf Vom Hagen, Thomas Matthew Gregorich +1 more | 2023-11-14 |
| 10859515 | Method and system for spectral characterization in computed tomography x-ray microscopy system | Zhifeng Huang, Lourens B. Steger | 2020-12-08 |
| 10838191 | Method of operating a microscope | Susan Candell, Lorenz Lechner | 2020-11-17 |
| 10335104 | Multi energy X-ray microscope data acquisition and image reconstruction system and method | Susan Candell, Srivatsan Seshadri, Paul McGuinness | 2019-07-02 |
| 10297048 | Segmentation and spectrum based metal artifact reduction method and system | Zhifeng Huang | 2019-05-21 |
| 10169865 | Multi energy X-ray microscope data acquisition and image reconstruction system and method | Susan Candell, Srivatsan Seshadri, Naomi Kotwal | 2019-01-01 |
| 9953798 | Method and apparatus for generation of a uniform-profile particle beam | Josh Star-Lack, Brian P. Wilfley | 2018-04-24 |
| 9520263 | Method and apparatus for generation of a uniform-profile particle beam | Josh Star-Lack, Brian P. Wilfley | 2016-12-13 |
| 9142382 | X-ray source with an immersion lens | David L. Adler, Wenbing Yun | 2015-09-22 |
| 9128584 | Multi energy X-ray microscope data acquisition and image reconstruction system and method | Susan Candell, Srivatsan Seshadri, Paul McGuinness | 2015-09-08 |
| 8995622 | X-ray source with increased operating life | David L. Adler, Wenbing Yun | 2015-03-31 |
| 8831179 | X-ray source with selective beam repositioning | David L. Adler, Wenbing Yun | 2014-09-09 |
| 8068579 | Process for examining mineral samples with X-ray microscope and projection systems | Wenbing Yun, Michael Feser, Andrei Tkachuk, Frederick W. Duewer, Hauyee Chang | 2011-11-29 |
| 7974379 | Metrology and registration system and method for laminography and tomography | Wenbing Yun, Alan Francis Lyon | 2011-07-05 |
| 4818937 | Rapid line scan NMR imaging | David C. Ailion, Krishnamurthy Ganesan | 1989-04-04 |
| 4583044 | NMR imaging method | Duane D. Blatter, David C. Ailion | 1986-04-15 |