Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12056894 | Method for imaging a region of interest of a sample using a tomographic X-ray microscope, microscope, system and computer program | Thomas A. Case, Susan Candell, Naomi Kotwal, Allen Gu, Wayne Broderick | 2024-08-06 |
| 10838191 | Method of operating a microscope | Susan Candell, Thomas A. Case | 2020-11-17 |
| 9947507 | Method for preparing cross-sections by ion beam milling | — | 2018-04-17 |
| 9905394 | Method for analyzing an object and a charged particle beam device for carrying out this method | Sreenivas Naga Bhattiprolu | 2018-02-27 |
| 9570269 | Method for manufacturing a TEM-lamella and assembly having a TEM-lamella protective structure | — | 2017-02-14 |
| 9558911 | Method for analyzing and/or processing an object as well as a particle beam device for carrying out the method | Josef Biberger, Michal Postolski, Ralph Pulwey, Marcin Janaszewski | 2017-01-31 |
| 9312093 | Particle beam device comprising an electrode unit | Joerg Fober, Edgar Fichter, Kai Schubert, Dirk Preikszas, Christian Hendrich +2 more | 2016-04-12 |
| 9140656 | Method of operating a particle beam microscope and a particle beam microscope | — | 2015-09-22 |
| 9103753 | TEM-lamella, process for its manufacture, and apparatus for executing the process | Ute Kaiser, Johannes Biskupek | 2015-08-11 |
| 8865268 | Method and apparatus | Samiul Haque, Reijo Lehtiniemi, Asta Maria Karkkainen, Pertti Hakonen | 2014-10-21 |
| 8835843 | Particle beam system and method of processing a TEM-sample | — | 2014-09-16 |