| 8139846 |
Verification of integrated circuits against malicious circuit insertions and modifications using non-destructive X-ray microscopy |
Michael A. Bajura, John N. Damoulakis, Younes Boulghassoul, Michael Feser |
2012-03-20 |
| 8068579 |
Process for examining mineral samples with X-ray microscope and projection systems |
Wenbing Yun, Michael Feser, Thomas A. Case, Frederick W. Duewer, Hauyee Chang |
2011-11-29 |
| 7813475 |
X-ray microscope with switchable x-ray source |
Ziyu Wu, Wenbing Yun, Peiping Zhu, Yuxin Wang, Qingxi Yuan +2 more |
2010-10-12 |
| 7796725 |
Mechanism for switching sources in x-ray microscope |
Ziyu Wu, Wenbing Yun, Peiping Zhu, Yuxin Wang, Qingxi Yuan +2 more |
2010-09-14 |
| 7443953 |
Structured anode X-ray source for X-ray microscopy |
Wenbing Yun, Frederick W. Duewer, Michael Feser, Srivatsan Seshadri |
2008-10-28 |