HC

Hauyee Chang

UE US Dept of Energy: 2 patents #577 of 5,099Top 15%
CM Carl Zeiss X-Ray Microscopy: 1 patents #23 of 37Top 65%
UE U.S. Department Of Energy: 1 patents #118 of 559Top 25%
XR Xradia: 1 patents #17 of 25Top 70%
📍 Berkeley, CA: #1,011 of 3,731 inventorsTop 30%
🗺 California: #106,790 of 386,348 inventorsTop 30%
Overall (All Time): #949,543 of 4,157,543Top 25%
5
Patents All Time

Issued Patents All Time

Showing 1–5 of 5 patents

Patent #TitleCo-InventorsDate
11821860 Optical three-dimensional scanning for collision avoidance in microscopy system Lars Omlor 2023-11-21
8068579 Process for examining mineral samples with X-ray microscope and projection systems Wenbing Yun, Michael Feser, Andrei Tkachuk, Thomas A. Case, Frederick W. Duewer 2011-11-29
6660414 Tungsten-doped thin film materials Xiao-Dong Xiang, Chen Gao, Ichiro Takeuchi, Peter G. Schultz 2003-12-09
6285049 Low loss composition of BaxSryCa1-x-yTiO3: Ba0.12-0.25Sr0.35-0.47Ca0.32-0.53TiO3 Xiao-Dong Xiang, Ichiro Takeuchi 2001-09-04
6146907 Method of forming a dielectric thin film having low loss composition of Ba.sub.x Sr.sub.y Ca.sub.1-x-y TiO.sub.3 : Ba.sub.0.12-0.25 Sr.sub.0.35-0.47 Ca.sub.0.32-0.53 TiO.sub.3 Xiao-Dong Xiang, Ichiro Takeuchi 2000-11-14