Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7752580 | Method and system for analyzing an integrated circuit based on sample windows selected using an open deterministic sequencing technique | Jason D. Hibbeler, Rouwaida N. Kanj, Daniel N. Maynard, Sani R. Nassif, Evanthia Papadopoulou | 2010-07-06 |
| 7752589 | Method, apparatus, and computer program product for displaying and modifying the critical area of an integrated circuit design | Robert J. Allen, Matthew T. Guzowski, Jason D. Hibbeler, Daniel N. Maynard, Kevin W. McCullen +3 more | 2010-07-06 |
| 7661080 | Method and apparatus for net-aware critical area extraction | Evanthia Papadopoulou, Mervyn Y. Tan | 2010-02-09 |
| 7634745 | Method for computing the critical area of compound fault mechanisms | Robert J. Allen, Mervyn Y. Tan | 2009-12-15 |
| 7503021 | Integrated circuit diagnosing method, system, and program product | Matt Boucher, John M. Cohn, Richard Dauphin, Mark E. Masters, Judith H. McCullen +1 more | 2009-03-10 |