| 11354358 |
Organization and retrieval of conditioned data |
— |
2022-06-07 |
| 10303719 |
Organization and retrieval of conditioned data |
— |
2019-05-28 |
| 9888347 |
Resolving location criteria using user location data |
— |
2018-02-06 |
| 7818694 |
IC layout optimization to improve yield |
Robert J. Allen, Faye D. Baker, Albert M. Chu, Michael S. Gray, Jason D. Hibbeler +2 more |
2010-10-19 |
| 7810060 |
Critical area computation of composite fault mechanisms using Voronoi diagrams |
Robert J. Allen, Evanthia Papadopoulou |
2010-10-05 |
| 7752589 |
Method, apparatus, and computer program product for displaying and modifying the critical area of an integrated circuit design |
Robert J. Allen, Sarah C. Braasch, Matthew T. Guzowski, Jason D. Hibbeler, Daniel N. Maynard +3 more |
2010-07-06 |
| 7685553 |
System and method for global circuit routing incorporating estimation of critical area estimate metrics |
Evanthia Papadopoulou, Ruchir Puri, Louise H. Trevillyan, Hua Xiang |
2010-03-23 |
| 7661080 |
Method and apparatus for net-aware critical area extraction |
Evanthia Papadopoulou, Sarah C. Braasch |
2010-02-09 |
| 7634745 |
Method for computing the critical area of compound fault mechanisms |
Robert J. Allen, Sarah C. Braasch |
2009-12-15 |
| 7503020 |
IC layout optimization to improve yield |
Robert J. Allen, Faye D. Baker, Albert M. Chu, Michael S. Gray, Jason D. Hibbeler +2 more |
2009-03-10 |
| 7404159 |
Critical area computation of composite fault mechanisms using Voronoi diagrams |
Robert J. Allen, Evanthia Papadopoulou |
2008-07-22 |
| 7310788 |
Sample probability of fault function determination using critical defect size map |
Robert J. Allen |
2007-12-18 |
| 7302653 |
Probability of fault function determination using critical defect size map |
Robert J. Allen |
2007-11-27 |
| 7260790 |
Integrated circuit yield enhancement using Voronoi diagrams |
Robert J. Allen, Michael S. Gray, Jason D. Hibbeler, Robert F. Walker |
2007-08-21 |
| 7240306 |
Integrated circuit layout critical area determination using Voronoi diagrams and shape biasing |
Robert J. Allen, Peter Chan, Evanthia Papadopoulou, Sarah C. Prue |
2007-07-03 |
| 7143371 |
Critical area computation of composite fault mechanisms using voronoi diagrams |
Robert J. Allen, Evanthia Papadopoulou |
2006-11-28 |
