Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12422377 | Defect inspection apparatus and defect inspection method | Toshifumi Honda, Takanori Kondo, Masami Makuuchi | 2025-09-23 |
| 12345661 | Defect inspection apparatus and defect inspection method | Toshifumi Honda, Shunichi Matsumoto | 2025-07-01 |
| 12235223 | Method for defect inspection, system, and computer-readable medium | Takanori Kondo, Takahiro Urano | 2025-02-25 |
| 12044627 | Defect inspection device and defect inspection method | Masaya Yamamoto, Toshifumi Honda, Masami Makuuchi, Shunichi Matsumoto | 2024-07-23 |
| 11346791 | Inspection device and inspection method thereof | Masami Makuuchi, Toshifumi Honda, Shunichi Matsumoto, Akira Hamamatsu | 2022-05-31 |
| 11143600 | Defect inspection device | Toshifumi Honda, Masami Makuuchi, Shunichi Matsumoto, Akira Hamamatsu | 2021-10-12 |
| 9036141 | Surface inspection apparatus and surface inspection method | Terumi Obuchi, Hiroshi Kikuchi, Yuji Inoue, Kazuo Takahashi | 2015-05-19 |
| 8558999 | Defect inspection apparatus and method utilizing multiple inspection conditions | Koji Kawaki, Atsushi Takane, Hiroshi Kikuchi, Yuji Inoue | 2013-10-15 |