Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8558999 | Defect inspection apparatus and method utilizing multiple inspection conditions | Atsushi Takane, Hiroshi Kikuchi, Nobuhiro Obara, Yuji Inoue | 2013-10-15 |
| 6718426 | Cache memory apparatus and central processor, hand-held device and arithmetic processor using the same | Hidemitsu Naya, Hideyuki Okamoto, Yuji Sugaya, Yuichiro Morita, Yoshitaka Takahashi | 2004-04-06 |