Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12417090 | Software development observability platform | David Shanley, Mikhael Zharov, Jacob Davis, Matthew Vernon Hanson, Thomas Beardsley Bender +4 more | 2025-09-16 |
| 7222274 | Testing and repair methodology for memories having redundancy | Dale B. Grosch, Toshiharu Saitoh, Guy M. Vanzo | 2007-05-22 |
| 7010733 | Parametric testing for high pin count ASIC | Robert W. Bassett, Garrett S Christensen, L. Farnsworth, Pamela S. Gillis | 2006-03-07 |
| 6931346 | Method and apparatus for reduced pin count package connection verification | Donald L. Wheater | 2005-08-16 |
| 6724210 | Method and apparatus for reduced pin count package connection verification | Donald L. Wheater | 2004-04-20 |
| 5127011 | Per-pin integrated circuit test system having n-bit interface | Algirdas J. Gruodis, Dale E. Hoffman, Charles A. Puntar, Kurt Paul Szabo | 1992-06-30 |