| 6154865 |
Instruction processing pattern generator controlling an integrated circuit tester |
Philip Theodore Kuglin |
2000-11-28 |
| 6092225 |
Algorithmic pattern generator for integrated circuit tester |
Philip Theodore Kuglin, Badih John Rask |
2000-07-18 |
| 6009546 |
Algorithmic pattern generator |
Philip Theodore Kuglin |
1999-12-28 |
| 5692121 |
Recovery unit for mirrored processors |
Ferenc M. Bozso, Yiu-Hing Chan, Philip G. Emma, David P. Hillerud, Scott Barnett Swaney |
1997-11-25 |
| 5412665 |
Parallel operation linear feedback shift register |
Piyushkumar C. Patel, Kurt Paul Szabo |
1995-05-02 |
| 5381421 |
Per pin circuit test system having N-bit pin interface providing speed improvement with frequency multiplexing |
John Edward Dickol, Dale E. Hoffman |
1995-01-10 |
| 5376849 |
High resolution programmable pulse generator employing controllable delay |
John Edward Dickol, Dinh L. Do |
1994-12-27 |
| 5285453 |
Test pattern generator for testing embedded arrays |
— |
1994-02-08 |
| 5127011 |
Per-pin integrated circuit test system having n-bit interface |
Michael Combs, Dale E. Hoffman, Charles A. Puntar, Kurt Paul Szabo |
1992-06-30 |
| 5097144 |
Driver circuit for testing bi-directional transceiver semiconductor products |
Albert Chang, Dale E. Hoffman, Daniel E. Skooglund |
1992-03-17 |
| 4779270 |
Apparatus for reducing and maintaining constant overshoot in a high speed driver |
Dale E. Hoffman, Charles A. Puntar, Daniel E. Skooglund |
1988-10-18 |
| 4639919 |
Distributed pattern generator |
Yi-Hua Chang, Hans P. Muhlfeld, Jr., Charles W. Rodriguez, Mark L. Shulman |
1987-01-27 |
| 4608706 |
High-speed programmable timing generator |
Yihua Chang, Lawrence J. Grasso, Carroll E. Morgan |
1986-08-26 |
| T100501 |
Integrated circuit layout utilizing separated active circuit and wiring regions |
John Balyoz |
1981-04-07 |
