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Performing sub-system attribute modification |
Karl O. Casserly, Bohdan Demczar, William P. Kostenko, John G. Torok |
2017-08-22 |
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Performing sub-system attribute modification |
Karl O. Casserly, Bohdan Demczar, William P. Kostenko, John G. Torok |
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Method for evaluating decoupling capacitor placement for VLSI chips |
Allan H. Dansky, Wiren D. Becker, Howard H. Smith, Peter J. Camporese, Kwok Fai Eng +1 more |
2003-09-09 |
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Method for evaluating decoupling capacitor placement for VLSI chips |
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Method for evaluating decoupling capacitor placement for VLSI chips |
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2001-11-27 |
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Per pin circuit test system having N-bit pin interface providing speed improvement with frequency multiplexing |
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Per-pin integrated circuit test system having n-bit interface |
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1992-06-30 |
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Driver circuit for testing bi-directional transceiver semiconductor products |
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1992-03-17 |
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Programmable delay line utilizing measured actual delays to provide a highly accurate delay |
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High speed digital counter |
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1990-05-08 |
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Apparatus for reducing and maintaining constant overshoot in a high speed driver |
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